Abstract
The possibility to estimate grain size and grain dispersion by means of approximate relations based on properties of various 3D tessellation is examined on planar sections of simulated tessellations and of a real material. Estimates of the mean grain size volume based on the mean area of planar grain profiles and on the mean intercept length are compared and further improved by taking into account the profile area variance.

Key words
polycrystalline grain structures, grain size, grain dispersion

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